S.R. Jadhav1, U.P. Khairnar2, G.P. Bhavsar2, P.H. Pawar3*
1Department of Physics, Rashtriya College, Chalisgaon - 424 101 (India)
2P.G. Department of Physics, Pratap College, Amalner (India)
3Department of Electronics, Jai Hind College, Dhule - 424 002 (India)
Article Received on : 21 Sep 2006
Article Accepted on : 17 Nov 2006
Article Published :
Plagiarism Check: Yes
Polycrystalline Lead Selenide Thin Films have been deposited onto glass substrate at 300K by thermal evaporation. The XRD study shows that all samples were polycrystalline having FCC structure. The surface morphology shows that as grown films are polycrystalline with crystallites randomly scattered on the surface. The transmittance and reflectance have been measured at normal and near normal incidence respectively, in the spectral range 200 to 2600 nm. The dependence of absorption coefficient a on the photon energy have been determined. Analysis of the result showed that for lead selenide films of different thicknesses, direct transition occurs, with band gap energy in the range 0.8 ev to 1.36 ev. Refractive indices and extinction coefficient have been evaluated in the above spectral range.
KEYWORDS: Optical properties; Lead selenide thin filmsCopy the following to cite this article: Jadhav S. R, Khairnar U. P, Bhavsar G. P, Pawar P. H. Optical Properties of Thermally Evapourated Lead Selenide Thin Films. Mat.Sci.Res.India;3(2a) |
Copy the following to cite this URL: Jadhav S. R, Khairnar U. P, Bhavsar G. P, Pawar P. H. Optical Properties of Thermally Evapourated Lead Selenide Thin Films. Mat.Sci.Res.India;3(2a). Available from: http://www.materialsciencejournal.org/?p=3311 |