Synthesis and Characterization of Aginse2 Thin Film and its Optical Properties

J.A. Borse, A.B. Gite, R.S. Dhake, K.A. Nerkar and S.P. Sonavani

Bhujbal Knowledge City, MET?s Institute of Engineering, Department of Physics Adgaon, Nashik - 422 003 (India).

DOI : http://dx.doi.org/10.13005/msri/060129

ABSTRACT:

AgInse2 thin film is developed by electrochemically deposition technique on stainless steel substrates in galvanostatics mode from an aqueous acidic bath containing AgCl3, InCl3, and SeO2. The growth kinetics of the film was studies by measurement of thickness i.e. Mass difference method. And the deposition parameters such as electrolyte bath concentration, deposition time, current density, and pH of electrolyte bath are optimized. The X-ray diffraction (XRD) analysis of the deposited film showed presence of polycrystalline nature. And the interplanner distance (d). The surface morphology studies by Scanning electron microscope (SEM) show that the deposited film is well adherent and uniform.

KEYWORDS: Electrodeposition; XRD; SEM; AgInSe2

Copy the following to cite this article: Borse J. A, Gite A. B, Dhake R. S, Nerkar K. A, Sonavani S. P. Synthesis and Characterization of Aginse2 Thin Film and its Optical Properties. Mat.Sci.Res.India;6(1)

Copy the following to cite this URL: Borse J. A, Gite A. B, Dhake R. S, Nerkar K. A, Sonavani S. P. Synthesis and Characterization of Aginse2 Thin Film and its Optical Properties. Mat.Sci.Res.India;6(1). Available from: http://www.materialsciencejournal.org/?p=3481

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